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"Our research is concerned with the optical and electronic processes that take place in organic semiconductors. In contrast to most inorganic semiconductors, organic materials can be processed easily, either by thermal evaporation or by from solution. This opens up new, highly promising manufacturing routes for the low-cost production of opto-electronic devices such as light-emitting displays (LEDs), solar cells and transistors."

"In order to advance organic devices it is imperative to understand very clearly how excited states or charges are generated, and what determines their energy and extent, how they migrate through the semiconductor, and how they decay."

"When addressing these issues we focus in particular on the relationship between electronic, chemical and morphological structure. We therefore use a range of time-resolved spectroscopic techniques in combination with electrical and structural studies."

"We report a modulation technique applicable to optical two-beam interferometers with unequal arm lengths that allows for highly precise, low-noise displacement measurements below the nanometer regime with a compact optical layout. The technique is inspired by frequency modulation (FM) spectroscopy and employs an external electro-optic modulator with sinusoidally phase modulated laser light in the radio-frequency (RF) regime (MHz frequencies). By combining the RF modulation with a secondary mechanical modulation at a lower frequency to a super-heterodyne scheme we achieve continuous sign-resolved tracking of the arm length difference over many wavelengths, and low-frequency laser noise is effectively suppressed. Our set-up is based on the compact interference lens (iLens) technique and can measure displacements of samples with a wide variety of surface qualities. We examined the system performance using two samples, a mirror surface and a commercial aneroid capsule without specular reflectivity. Stable multi-fringe operation with sub-nanometer resolution is demonstrated; the noise floor reaches 10 pm/√Hz at frequencies above 10 Hz in a regular laboratory environment. This work demonstrates a versatile, simple set-up capable of sign-resolved, sub-nanometer displacement sensing suitable even for non-ideal surface conditions."

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